About this Event
Time: April 17th at 3:45 pm
Location: Singh 035
Electrical measurements are commonly used to characterize various devices and materials. At micro- and nanoscale, electrical tests can become challenging. Establishing electrical contact with sub-micron or even few-nm precision may not be straightforward, signal-to-noise ratio must be adequate, the drift must be low, etc. Among tools available to researchers, level of control, precision and ease-of-use may vary quite greatly.
Electrical micro- and nanoprobers driven by piezo actuators like those developed at Imina Technologies are well-suited for electrical characterization at small scales, giving users the positioning control down to a few nm and excellent signal-to-noise ratio.
These probers can be used in combination with various setups: optical microscopes for micro-scale testing and manipulation; SEMs for nano-scale experiments; other setups such as AFMs, nanoindentors, cathodoluminescence and Raman spectroscopes for correlative analysis. They also allow for partial or full automation of the measurement process for arrays of similar devices.
In this talk, we will discuss how Imina electrical probers can be useful for research on 2D and nanoscale materials, photonics, semiconductors, functional materials, on both micro and nanoscale, with two examples shown in Fig 1 and 2. These probers reduce time spent on sample characterization thanks to quick in-situ checks, sometimes even without having to fabricate the contacts, and give users a key to more comprehensive understanding of materials and devices behaviour at micro and nanoscale.
Event Venue & Nearby Stays
Singh Center for Nanotechnology, QNF Cleanroom, Philadelphia, United States
